Said Hamdioui


Hamdioui is currently Chair Professor on Dependable and Emerging Computer Technologies and Head of the Computer Engineering Laboratory (CE-Lab) of the Delft University of Technology, the Netherlands. He received the MSEE and PhD degrees (both with honors) from TUDelft. Prior to joining TUDelft as a professor, Hamdioui spent about seven years within industry including Microprocessor Products Group at Intel Corporation (Califorina, USA), IP and Yield Group at Philips Semiconductors R&D (Crolles, France) and DSP design group at Philips/ NXP Semiconductors (Nijmegen, The Netherlands). His research focuses on two domains: Dependable CMOS nano-computing (including Reliability, Testability, Hardware Security) and emerging technologies and computing paradigms (including 3D stacked ICs, memristors for logic and storage, in-memory-computing for big-data applications).

Hamdioui owns two patents, has published one book and contributed to other two, and had co-authored over 180 conference and journal papers. He has consulted for many companies (such as Intel, ST, Altera, Atmel, Renesas, …) in the area of memory testing and has collaborated with many industry/research partners (examples are Intel, IMEC, NXP, Intrinsic ID, DS2, ST Microelectronics, Cadence, Politic di Torino, etc) in the field of dependable nano-computimng and emerging technologies. He is strongly involved in the international community as a member of organizing committees (e.g., general chair, program chair, etc) or a member of the technical program committees of the leading conferences. He delivered dozens of keynote speeches, distinguished lectures, and invited presentations and tutorial at major international forums/conferences/schools and at leading semiconductor companies. Hamdioui is a Senior member of the IEEE, Associate Editor of IEEE Transactions on VLSI Systems (TVLSI), and he serves on the editorial board of IEEE Design & Test, Elsevier Microelectronic Reliability Journal, and of the Journal of Electronic Testing: Theory and Applications (JETTA). He is also member of AENEAS/ENIAC Scientific Committee Council (AENEAS =Association for European NanoElectronics Activities).

Hamdioui is the recipient of many international/national awards. E.g., he  is the the recipient of European Design Automation Association Outstanding Dissertation Award 2001; Best Paper Award at the International Conference on Frontier of Computer Science and Technology FCST-2017; Teacher of the Year Award at the faculty of Electrical Engineering, Delft University of Technology, the Netherlands; Best Paper Award at IEEE Computer Society Annual Symposium on VLSI (IVLSI) 2016; the 2015 HiPEAC Technology Transfer Award, Best Paper Award at 33rd IEEE International Conference on Computer Design ICCD 2015, Best paper Award at International conference on Design and Test of Integrated Systems in the nano-era DTIS 2011, IEEE Nano and Nano Korea award at IEEE NANO 2010, Intel informal Award for developed test methods for embedded caches in Itanuim processors. In addition, he is a leading member of Cadence Academic Network on Dependability and Design-for-Testability, and he was nominated for The Young Academy of the Royal Netherlands Academy of Arts and Sciences (KNAW) in 2009.


Prof.dr. S. Hamdioui

2006 - VLSI Test Technology & Reliability
2007 - Algorithms and Data Structures
2007 - System Programming in C
2007 - VLSI Test Technology & Reliability
2008 - System Programming in C
2008 - Algorithms and Data Structures
2008 - VLSI Test Technology & Reliability
2009 - VLSI Test Technology & Reliability
2009 - Algorithms and Data Structures
2009 - System Programming in C
2010 - System Programming in C
2010 - VLSI Test Technology & Reliability
2010 - Algorithms and Data Structures
2011 - System Programming in C
2011 - Algorithms and Data Structures
2011 - VLSI Test Technology & Reliability
2014 - VLSI Test Technology & Reliability
2012 - Algorithms and Data Structures
2014 - Computer Architecture and Organisation
2012 - VLSI Test Technology & Reliability
2012 - System Programming in C
2012 - Computerarchitectuur en organisatie
2013 - Computerarchitectuur en organisatie
2013 - VLSI Test Technology & Reliability
2016 - Computer Architecture and Organisation
2016 - VLSI Test Technology & Reliability
2017 - Computer Architecture and Organisation
2015 - VLSI Test Technology & Reliability
2015 - Computer Architecture and Organisation
2018 - Computer Architecture and Organisation
2018 - VLSI Test Technology & Reliability
2017 - VLSI Test Technology & Reliability