DIAM
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- Publications
- Urn and jump processes for modeling dependence and rating transitions in the field of credit risk
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- Group Applied Probability
Risk
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- Past Events
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Nederlands

DIAM
Education
Research
- Publications
- Urn and jump processes for modeling dependence and rating transitions in the field of credit risk
People
- Group Applied Probability
Risk
- Downloads
- Software
Events
- Past Events
- Seminars
Alumni

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EEMCS
The faculty
Departments
Applied Mathematics
Applied Probability
Risk
Software

DIAM
Education
Research
People
Risk
- Downloads
- Software
Events
Alumni

Software

Software like Uninet (Uninet, Unigraph, Unisens, Unicorn) you can find on this page:

www.lighttwist.net/wp/uninet

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Delft Institute of Applied Mathematics

Applied Probability

Mekelweg 4 (Visitor address)
2628 CD Delft

Mrs. S. van Gentevoort
Phone: +31 (0)15 2781939
E-mail: s.vangentevoort@tudelft.nl

DIAM
Education
Research
- Publications
- Urn and jump processes for modeling dependence and rating transitions in the field of credit risk
People
- Group Applied Probability
Risk
- Downloads
- Software
Events
- Past Events
- Seminars
Alumni
Nederlands