Bernd Rieger

Research Interest: Computational microscopy, Optical nanoscopy, Image processing, Electron microscopy

 

Academic Background: 
Bernd Rieger (1973) is a professor at the faculty of Applied Sciences of the Delft University of Technology, the Netherlands. He received the M.Sc. degree in physics from the Technische Universität München, Germany, in 1999. He received his Ph.D. degree in 2004 in image processing and analysis from the Delft University of Technology, Delft. Thereafter he spent one and a half years as a postdoctoral researcher at the Max Planck Institute for Biophysical Chemistry, Göttingen, Germany in the group of Dr. Tom Jovin. From 2005 to 2010 he worked for FEI Electron Optics, Eindhoven, the Netherlands; from 2006 part-time when he joined the Department of Imaging Physics at TU Delft. He started as a tenure track assistant professor, received tenure in 2010, was promoted to associate professor in 2014 and appointed Antoni van Leeuwenhoek full professor in 2017.
His research interests focus on the field of Computational Microscopy that is combining imaging physics and image processing for the application field of light and electron microscopy, in particular for life sciences at the biomolecular level.

 

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Annelies van Beek

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