Dry Etch Recipe for W (sputtered) in Fluorine based RIE

Recipe

Gases:
SF612.5 sccm
He10 sccm
Pressure1.00 Pa
RF Power40 W
Bias potential-120 V

Etch characteristics

Etch rate: 80 nm/min
Anisotropy: 80 %

Selectivity

Selective over all non-organic materials

Remarks

Anisotropy is somewhat substrate temperature dependent
Reproducibility: 15 %