C.T.H. Heerkens

publications
Fabrication of narrow-gap nanostructures using electron-beam induced deposition etch masks

peer reviewed : Y

Microelectronic Engineering (2016) 6 pages , p. 77-82

authors

  • IGC Weppelman
  • PC Post
  • CTH Heerkens
  • CW Hagen
  • JP Hoogenboom
Multi-electron-beam deflector array

peer reviewed : Y

Microelectronic Engineering (2014) 9 pages , p. 140-148

authors

  • AC Zonnevylle
  • CTH Heerkens
  • CW Hagen
  • P Kruit
Design of a liquid flow cell for live cell observation in an integrated light and electron microscope

peer reviewed : N

NEVAC Blad (2013) 4 pages , p. 6-9

authors

  • DW Morsink
  • AC Zonnevylle
  • DSB van Oosten Slingeland
  • N Liv
  • CTH Heerkens
  • APJ Effting
  • U Staufer
  • JP Hoogenboom
Design and fabrication of a miniaturized gas ionization chamber for production of high quality ion beams

peer reviewed : Y

Microelectronic Engineering (2012) 4 pages , p. 134-137

authors

  • DS Jun
  • VG Kutchoukov
  • CTH Heerkens
  • P Kruit
Boron-layer silicon photodiodes for high-efficiency low-energy electron detection

peer reviewed : Y

Solid-State Electronics (2011) 7 pages , p. 38-44

authors

  • A Sakic
  • LK Nanver
  • TLM Scholtes
  • CTH Heerkens
  • T Knezevic
  • G van Veen
  • K Kooijman
  • P. Vogelsang
Electrostatic rotator for alignment purposes in multi electron beam systems

peer reviewed : Y

Microelectronic Engineering (2010) 5 pages , p. 1095-1099

authors

  • AC Zonnevylle
  • CTH Heerkens
  • P Kruit
  • ML Wieland
  • FM Postma
  • SWHK Steenbrink
Silicon photodiodes for high-efficiency low-energy electron detection

peer reviewed : Y

Proceedings of IEEE 40th European Solid-State Device Research Conference (ESSDERC 2010) (2010) 4 pages , p. 102-105

authors

  • A Sakic
  • LK Nanver
  • TLM Scholtes
  • CTH Heerkens
  • G van Veen
  • K Kooijman
  • P. Vogelsang

editors

Ultrashallow junction silicon photodiodes for detection of low energy electrons

peer reviewed : Y

Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010 (2010) 4 pages , p. 150-153

authors

  • A Sakic
  • LK Nanver
  • TLM Scholtes
  • CTH Heerkens
  • G van Veen
  • K Kooijman
  • P. Vogelsang

editors

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

peer reviewed : Y

Proceedings 2010 IEEE International Electron Devices Meeting (IEDM) (2010) 4 pages , p. 1-4

authors

  • A Sakic
  • LK Nanver
  • G van Veen
  • K Kooijman
  • P. Vogelsang
  • TLM Scholtes
  • WB De Boer
  • WHA Wien
  • S Milosavljevic
  • CTH Heerkens
  • T Knezevic
  • I Spee

editors

Electron beam induced deposited etch masks

peer reviewed : Y

Microelectronic Engineering (2009) 4 pages , p. 961-964

authors

  • CTH Heerkens
  • MJ Kamerbeek
  • WF van Dorp
  • CW Hagen
  • J Hoekstra
ancillary activities
-Geen nevenwerkzaamheden -

2016-01-01 - 2018-01-01