Publications

• 2024

  Optical STEM detection for scanning electron microscopy

  Arent J. Kievits / B. H.Peter Duinkerken / Job Fermie / Ryan Lane / Ben N.G. Giepmans / Jacob P. Hoogenboom

• 2023

  Integrated optical and charged particle inspection apparatus

• 2023

  Introductie Elektriciteit en Magnetisme

  W.G. Bouwman / J.P. Hoogenboom / R.P.H. Haaksman

• 2023

  Need for Speed

  Imaging Biological Ultrastructure with the 64-beams FAST-EM
  Arent J. Kievits / B. H. Peter Duinkerken / Ben N.G. Giepmans / Jacob P. Hoogenboom

• 2023

  Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM

  Radim Skoupý / Daan B. Boltje / Miroslav Slouf / Kateřina Mrázová / Tomáš Láznička / Clémence M. Taisne / Vladislav Krzyžánek / Jacob P. Hoogenboom / Arjen J. Jakobi

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