Prof.dr.ir. P. Kruit

subjects
2005 - Argumentation and Philosophy of Science
2006 - Physics 2
2006 - Argumentation and Philosophy of Science
2006 - Introduction to Charged Particle Optics
2007 - Physics 2
2007 - Argumentation and Philosophy of Science
2007 - Introduction to Charged Particle Optics
2008 - Physics 2
2008 - Argumentation and Philosophy of Science
2008 - Introduction to Charged Particle Optics
2010 - Introduction to Charged Particle Optics
2011 - Orientation on Physics Research
2009 - Mechanics, waves and optics
2009 - Physics 1 A
2009 - Introduction to Charged Particle Optics
2010 - Bachelor Thesis
2010 - Physics 1 A
2011 - Inleiding Mechanica, golven en optica
2012 - Inleiding Mechanica, golven en optica
2012 - Orientation on Physics Research
2011 - Introduction to Charged Particle Optics
2014 - The Interpretation of Quantum Mechanics
2014 - Inleiding Mechanica, golven en optica
2013 - Introduction to Charged Particle Optics
2014 - Introduction to Charged Particle Optics
2013 - Inleiding Mechanica, golven en optica
2015 - Introduction to Charged Particle Optics
2012 - Introduction to Charged Particle Optics
2016 - Introduction to Charged Particle Optics
2016 - Introduction to Mechanics, Waves and Optics
2017 - The Interpretation of Quantum Mechanics
2016 - The Interpretation of Quantum Mechanics
2017 - Introduction to Charged Particle Optics
2015 - Introduction to Mechanics, Waves and Optics
2015 - The Interpretation of Quantum Mechanics
2017 - Introduction to Mechanics, Waves and Optics
ancillary activities
-Lid RVT, RVC, of RVA - MAPPER Lithography BV

2016-01-01 - 2018-01-01

Industrie

-Adviseur/Consultant - DELMIC BV

2016-01-01 - 2018-01-01

Industrie

publications
Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers

peer reviewed : Y

Scientific Reports (2017)

authors

  • Martijn Haring
  • Nalan Liv Hamarat
  • Christiaan Zonnevylle
  • Angela Narvaez Gonzalez
  • Lennard Voortman
  • Pieter Kruit
  • Jacob Hoogenboom
Transmission electron imaging in the Delft multibeam scanning electron microscope 1

peer reviewed : Y

Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics (2016)

authors

  • Yan Ren
  • Pieter Kruit
Coulomb interactions in sharp tip pulsed photo field emitters

peer reviewed : Y

Applied Physics Letters (2016)

authors

  • Ben Cook
  • Pieter Kruit
Apparatus and method for inspecting a surface of a sample

peer reviewed : N

(2016)

authors

Lithography system

peer reviewed : N

(2016)

authors

  • Johannes Christiaan van 't Spijker
  • Remco Jager
  • Marco Jan-Jaco Wieland
  • Pieter Kruit
Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope

peer reviewed : N

(2016)

authors

  • Jacob Hoogenboom
  • Nalan Liv Hamarat
  • Pieter Kruit
MBSEM image acquisition and image processing in LabView FPGA

peer reviewed : Y

IWSSIP 2016 - Proceedings of the 23rd International Conference on Systems, Signals and Image Processing (2016)

authors

  • Shammi Rahangdale
  • Paul Keijzer
  • P. Kruit
Integrated optical and charged particle inspection apparatus

peer reviewed : N

(2016)

authors

  • Jacob Hoogenboom
  • Christiaan Zonnevylle
  • Pieter Kruit
  • Angela Narvaez Gonzalez
A high-current scanning electron microscope with multi-beam optics

peer reviewed : Y

Microelectronic Engineering (2016) 7 pages , p. 132-138

authors

  • Takashi Doi
  • Minoru Yamazaki
  • Takashi Ichimura
  • Yan Ren
  • P. Kruit
Designs for a quantum electron microscope

peer reviewed : Y

Ultramicroscopy (2016) 15 pages , p. 31-45

authors

  • P. Kruit
  • R. G. Hobbs
  • C. S. Kim
  • Y. Yang
  • V. R. Manfrinato
  • J. Hammer
  • S. Thomas
  • P. Weber
  • B. Klopfer
  • C. Kohstall
  • T. Juffmann
  • M. A. Kasevich
  • P. Hommelhoff
  • K. K. Berggren