Colloquium: Sonny Lie (Space Flight)

12 december 2019 14:00 - Locatie: Lecture Room G, Faculty of Aerospace Engineering, Kluyverweg 1, Delft

3D NAND memory as radiation monitor

Monitoring space radiation is key in understanding the effects of radiation on electronics. Current radiation monitors are heavy and bulky making them unsuitable for small satellites. The low cost, weight and volume 3D NAND flash memory makes it an attractive commercial-of-the-shelf product to monitor space radiation.

3D NAND flash memory stores data by assigning a threshold voltage to a memory cell. Radiation affects the threshold voltage causing a threshold voltage shift and can be read by using in-house developed hardware and software. 

This thesis investigates the effects of radiation on 3D NAND memory cells from test data obtained at CERN and from Monte Carlo Simulations performed with Geant4.

The objective of this research is to analyze the capabilities of 3D NAND flash memory as radiation monitor.