Publicaties

• 2024

  Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling

• 2024

  Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam

• 2024

  Optical STEM detection for scanning electron microscopy

  Arent J. Kievits / B. H.Peter Duinkerken / Job Fermie / Ryan Lane / Ben N.G. Giepmans / Jacob P. Hoogenboom

• 2023

  Integrated optical and charged particle inspection apparatus

• 2023

  Introductie Elektriciteit en Magnetisme

  W.G. Bouwman / J.P. Hoogenboom / R.P.H. Haaksman

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