Jacob Hoogenboom
Research Interest: Integrated microscopy, SEM fluorescence CLEM, Ultrafast microscopy, Molecular nanophotonics
Academic Background:
Jacob Hoogenboom (1972) is associate professor at Delft University of Technology since October 2008. He obtained his PhD in September 2002 from Utrecht University for research conducted at the FOM Institute for Atomic and Molecular Physics (AMOLF) in Amsterdam. In the following years, he worked as a postdoctoral researcher at the MESA+ Institute for Nanotechnology at University of Twente and as a research fellow at ICFO - the Institute of Photonic Sciences in Castelldefels (Barcelona) in Spain. In 2008, he spent 8 months at Utrecht University.
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2024
Optical STEM detection for scanning electron microscopy
Arent J. Kievits / B. H.Peter Duinkerken / Job Fermie / Ryan Lane / Ben N.G. Giepmans / Jacob P. Hoogenboom
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2023
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2023
Introductie Elektriciteit en Magnetisme
W.G. Bouwman / J.P. Hoogenboom / R.P.H. Haaksman
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2023
Need for Speed
Imaging Biological Ultrastructure with the 64-beams FAST-EM
Arent J. Kievits / B. H. Peter Duinkerken / Ben N.G. Giepmans / Jacob P. Hoogenboom -
2023
Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
Radim Skoupý / Daan B. Boltje / Miroslav Slouf / Kateřina Mrázová / Tomáš Láznička / Clémence M. Taisne / Vladislav Krzyžánek / Jacob P. Hoogenboom / Arjen J. Jakobi
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Onderwijs 2023
Onderwijs 2022
* The above keywords are automatically generated by the TU Delft research portal
