FEI NovaNanoSEM

Apparatus

  

FEI NovaNano SEM

Supplier

 

FEI; www.fei.com

Location

 

P.00.480

Function

 

Specimen surface inspection

Main purpose

 

Ultra high resolution and Low vacuum inspection

Main Characteristics

   

Facilities

 

EDX

Specimen

 

Max. 4 inch in diameter

Equipment owner

 

Hozanna Miro

h.miro@tudelft.nl

+31 650559998

 

Lodi Schriek (back-up)

L.N.Schriek@tudelft.nl

+31 634321293