Titan aberration-corrected TEM

Apparatus

  

Titan aberration-corrected Transmission Electron Microscope

Supplier

 

Thermo Fisher (FEI)

Location

 

VLL, outside cleanroom

Applications

 

- structural characterization

- chemical characterization

 

 

 

Specifications/

Capabilities

 

- this microscope works at 300kV

- conventional TEM modes

- scanning transmission electron microscopy (STEM) mode

- convergent beam and selected area electron diffraction modes

- point-to-point spatial resolution in TEM mode: 0.10 nm at 300kV

- STEM resolution: 0.12 nm at 300kV

- CETA 16M camera

- ChemiSTEM system for energy-dispersive X-ray spectroscopy (EDX) chemical compositional analysis

- GIF spectrometer for electron energy-loss spectroscopy (EELS)

 

 

 

Sample Resctrictions

 

- sample thickness: 100 nm or less

- maximum sample size: 3nm diameter

- materials to be analyzed must be approved by staff (F. Tichelaar and S. Conesa-Boj)

- no magnetic materials

- materials toxic or potentially toxic are not allowed

Equipment Owner

 

Frans Tichelaar

F.D.Tichelaar@tudelft.nl

+31 152782252

 

If you would like to request access to the Titan microscope, please contact Dr Sonia Conesa-Boj

for further information, S.C.ConesaBoj@tudelft.nl