Jacob Hoogenboom
Research Interest: Integrated microscopy, SEM fluorescence CLEM, Ultrafast microscopy, Molecular nanophotonics
Academic Background:
Jacob Hoogenboom (1972) is associate professor at Delft University of Technology since October 2008. He obtained his PhD in September 2002 from Utrecht University for research conducted at the FOM Institute for Atomic and Molecular Physics (AMOLF) in Amsterdam. In the following years, he worked as a postdoctoral researcher at the MESA+ Institute for Nanotechnology at University of Twente and as a research fellow at ICFO - the Institute of Photonic Sciences in Castelldefels (Barcelona) in Spain. In 2008, he spent 8 months at Utrecht University.
-
2023
Need for Speed
Imaging Biological Ultrastructure with the 64-beams FAST-EM
Arent J. Kievits / B. H. Peter Duinkerken / Ben N.G. Giepmans / Jacob P. Hoogenboom -
2023
Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
Radim Skoupý / Daan B. Boltje / Miroslav Slouf / Kateřina Mrázová / Tomáš Láznička / Clémence M. Taisne / Vladislav Krzyžánek / Jacob P. Hoogenboom / Arjen J. Jakobi
-
2022
A cryogenic, coincident fluorescence, electron and ion beam microscope
Daan B. Boltje / Jacob P. Hoogenboom / Arjen J. Jakobi / Grant J. Jensen / Caspar T.H. Jonker / Max J. Kaag / Cecilia de Agrela Pinto / Ernest B. van der Wee / Sander Den Hoedt / More Authors
-
2022
Correlative light and electron microscopy reveals fork-shaped structures at actin entry sites of focal adhesions
Karin Legerstee / Jason Sueters / Tsion E. Abraham / Johan A. Slotman / Gert Jan Kremers / Jacob P. Hoogenboom / Adriaan B. Houtsmuller
-
2022
Electron-beam patterned calibration structures for structured illumination microscopy
Sangeetha Hari / Johan A. Slotman / Yoram Vos / Christian Floris / Wiggert A. van Cappellen / C. W. Hagen / Sjoerd Stallinga / Adriaan B. Houtsmuller / Jacob P. Hoogenboom
-
* The above keywords are automatically generated by the TU Delft research portal
