Leitz Ergolux
Apparatus |
| Leitz 2, SWIR transmission microscope |
Supplier | Leitz + Hamamatsu + Olympus | |
Location | TU8 | |
Function | Transmission microscopy, imaging of silicon samples | |
Main purpose | Alignment, transmission measurements | |
Main Characteristics | Wavelength ~1000-1600 nm | |
Facilities | SWIR camera | |
Typical application | Inspection | |
Specimen | Any size; Silicon | |
Equipment owner | L.N. Schriek L.N.Schriek@tudelft.nl +31 634321293 EJ.M. Straver (back-up) E.J.M.Straver@tudelft.nl +31 618242212 |